Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC)
Yazarlar (2)
Doç. Dr. Abdullah AKKAYA Kırşehir Ahi Evran Üniversitesi, Türkiye
E. Ayyıldız
Erciyes Üniversitesi, Türkiye
Erciyes Üniversitesi, Türkiye
| Makale Türü | Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale) | ||
| Dergi Adı | Mapan Journal of Metrology Society of India (Q4) | ||
| Dergi ISSN | 0970-3950 Dergi Bilgileri (2020) | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | İngilizce | Basım Tarihi | 06-2020 |
| Cilt / Sayı / Sayfa | 35 / 3 / 343–350 | DOI | 10.1007/s12647-020-00381-6 |
| Makale Linki | [{”content-version”:”vor”,”content-type”:”application/pdf”,”intended-application”:”text-mining”,”URL”:”http://link.springer.com/content/pdf/10.1007/s12647-020-00381-6.pdf”},{”content-version”:”vor”,”content-type”:”text/html”,”intended-application”:”t | ||
| UAK Araştırma Alanları |
Yarı İletkenler
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| Özet |
| Metal–semiconductor (MS) contacts are main aspects of almost all electronic circuit elements. Thus, contact mechanism and its electrical properties to develop a faster and more reliable electronic device should be known. The electrical characterization of MS devices (in terms of temperature-dependent and/or independent current–voltage (I–V), capacitance–voltage (C–V) and capacitance–frequency (C–f) measurements) is applied frequently in methods for determining the electrical properties and how it works and what the possible applications are. We prepared a program for basic electrical measurements and parameter extraction from these measurements of MS contacts. It is important to prepare and use such a program for a research laboratory, because electrical measurements must be made quickly after the production process and users should be able to carry out this process easily. This work can be … |
| Anahtar Kelimeler |
| C–V–T | I–V–T | LCR meter | LN2-cooled cryostat | SMU | VEE pro |
BM Sürdürülebilir Kalkınma Amaçları
| Atıf Sayıları | |
| Web of Science | 10 |
| Scopus | 16 |
| Google Scholar | 19 |