| Yazarlar (2) |
Doç. Dr. Abdullah AKKAYA
Kırşehir Ahi Evran Üniversitesi, Türkiye |
E. Ayyildiz
|
| Özet |
| We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal-semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current-voltage (I-V), capacitance- voltage (C-V) and capacitance-frequency (C-f) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the C-f, temperature-dependent I-V and temperature-dependent C-V measurement results for one device, with our SeCLaS-PC program. |
| Anahtar Kelimeler |
| I-V | C-V | C-f | VEE pro | metal-semiconductor contacts |
| Makale Türü | Özgün Makale |
| Makale Alt Türü | SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale |
| Dergi Adı | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS |
| Dergi ISSN | 0218-1266 Wos Dergi Scopus Dergi |
| Dergi Tarandığı Indeksler | SCI-Expanded |
| Makale Dili | İngilizce |
| Basım Tarihi | 10-2020 |
| Cilt No | 29 |
| Sayı | 13 |
| Sayfalar | 2050215 / 2050215 |
| Doi Numarası | 10.1142/S0218126620502151 |
| Atıf Sayıları | |
| WoS | 11 |
| SCOPUS | 11 |
| Google Scholar | 14 |
