Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC)
Yazarlar (2)
Doç. Dr. Abdullah AKKAYA Kırşehir Ahi Evran Üniversitesi, Türkiye
E. Ayylldlz
Erciyes Üniversitesi, Türkiye
Erciyes Üniversitesi, Türkiye
| Makale Türü | Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale) | ||
| Dergi Adı | Journal of Circuits Systems and Computers | ||
| Dergi ISSN | 0218-1266 Wos Dergi Scopus Dergi | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | İngilizce | Basım Tarihi | 10-2020 |
| Cilt / Sayı / Sayfa | 29 / 13 / 2050215–2050215 | DOI | 10.1142/S0218126620502151 |
| Özet |
| We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal–semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current–voltage (–), capacitance– voltage (–) and capacitance–frequency (–) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the –, temperature-dependent – and temperature-dependent – measurement results for one device, with our SeCLaS-PC program. |
| Anahtar Kelimeler |
| I-V | C-V | C-f | VEE pro | metal-semiconductor contacts |
BM Sürdürülebilir Kalkınma Amaçları
| Atıf Sayıları | |
| WoS | 11 |
| SCOPUS | 11 |
| Google Scholar | 14 |