Investigation of Multi‐Phase Structure and Optoelectronic Performance of Bi‐Doped (Cu−Zn) Oxide Composite Thin Films
Yazarlar (4)
Öğr. Gör. Yasemin Altınay Mustafa Kemal Üniversitesi, Türkiye
Doç. Dr. Abdullah AKKAYA Kırşehir Ahi Evran Üniversitesi, Türkiye
Prof. Dr. Raşit Aydın Selçuk Üniversitesi, Türkiye
Prof. Dr. Bünyamin Şahin Necmettin Erbakan Üniversitesi, Türkiye
| Makale Türü |
Özgün Makale
(SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale)
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| Dergi Adı | Chemelectrochem (Q2) | ||
| Dergi ISSN | 2196-0216 Dergi Bilgileri (2023) | ||
| Dergi Tarandığı Indeksler | SCI-Expanded | ||
| Makale Dili | İngilizce | Basım Tarihi | 08-2023 |
| Cilt / Sayı / Sayfa | 10 / 17 / – | DOI | 10.1002/celc.202300208 |
| Makale Linki | http://dx.doi.org/10.1002/celc.202300208 | ||
| UAK Araştırma Alanları |
Nanoteknoloji
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| Özet |
| In this research, thin film composite structures were used to prepare optoelectronic devices from bare and Bi‐substituted p‐CuO/n‐ZnO systems. The p‐CuO/n‐ZnO composite thin film structures were prepared by the SILAR technique, and the influences of two different Bi contents on the structure and main physical performances of the samples were investigated. The X‐ray diffraction (XRD) technique showed that the composited thin film materials were multiphased in rutile hexagonal (wurtzite) phase (ZnO) and monoclinic tenorite phase (CuO) type crystal structure. The obtained surface morphological results presented that the structure exhibits an almost homogeneous, plate‐like surface distribution, and depending on the increase of Bi concentration, the plate‐like sheet area widens from ~2.5 μm to 10 μm and the layer boundaries decrease. FT‐IR and Raman spectroscopy were used to investigate the various … |
| Anahtar Kelimeler |
| Band gap | CuO | nanocomposite | resistivity | ZnO |
| Atıf Sayıları | |
| Web of Science | 4 |
| Scopus | 4 |
| Google Scholar | 6 |